Authors: T. Zurbuchen, P. Bochsler, and F. Scholze
Reference: Opt. Eng. 34 (1995) 1303-1315.
Abstract:
In space research electrostatic analyzers are frequently used in
combination with time-of-flight spectrometers and/or secondary electron
multipliers. The purpose of such electrostatic analyzers is not only to
determine the energy-to-charge ratios of particles but also to seperate
charged particles from EUV light. Since most particle detectors are
extremely sensitive to EUV, substantial suppression factors are
required in order to limit the undersired background counts caused by
EUV radiation. For instance, in a typical application for the
investigation of the solar-wind ion composition, a number ratio of EUV
photons to minor ions of the order of 109 is encountered.
Hence, the quality of an energy analyzer system crucially depends on
the optical design and on the EUV reflection properties of the
materials used. We present results from an investigation of EUV
reflection properties of several materials that are frequently employed
for the construction or for the surface treatment of ion-optical
instruments in space research.